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Test Pattern

Test signals for the calibration and alignment of TV broadcast and reception equipment.


Showing results: 166 - 180 of 205 items found.

  • Digital I/O PXI Express Card

    GX5292e - Terotest Systems Ltd.

    The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

  • Dynamically Controlled High Speed Digital I/O PXI Card

    GX5290 Series - Marvin Test Solutions, Inc.

    The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

  • Video Generator-Analyzer

    VQTS-200 - VideoQ Inc

    VQTS-200 is a self-contained solution, combining: 3G-SDI/HDMI/DVI player/recorder - based on AJA Kona LHi card Built-in RAID storage - uncompressed YUV signals in and out, up to 1080p60 Visual, instrumental and automated tests using VQL Test Patterns Library Sophisticated image quality VQMA3 software analyzer - complete quality report in 2 seconds Ideal tool for development labs, software developers and high volume manufacturers Easy-to-use tool, instantly revealing your video camera, codec, scaler, converter or other video device performance User-selectable reporting modes: machine-readable file with Pass/Fail marks detailed multi-page PDF document

  • Dual Channel Bit Synchronizer for Rates up to 45 Mbps

    LS-45-DB - Lumistar Inc.

    The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.

  • Multi-format Video Generator

    LT 4600A - Leader Electronics Corp.

    The LT 4600A multi-format video generator is a compact, 1U half-rack size SDI video signal generator that supports the triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) format. In addition to test pattern output including color bars and SDI check fields, the LT 4600A is equipped with numerous features such as ID characters, QVGA logo marks, safety area markers, audio embedding, genlock function for external reference input signals, and three analog black signal outputs.

  • Digital I/O PXI Card

    GX5290 - Terotest Systems Ltd.

    The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

  • Infrastructure

    dsTest - Developing Solutions, Inc.

    dsTest offers server emulation and client simulation capabilities for comprehensive testing of 3GPP core network interface functionality and performance. Select the interfaces required to accomplish your testing goals–surround a network element with client simulators that simulate client activity,  or provision a server emulator with the interfaces necessary to support end-to-end testing, test agents and proxies using both client simulation and server emulation. Test your LTE, EPC, eMBMS, SMS, WLAN Offload, VoLTE and CIoT networks, or gather Big Data to support the identification of patterns and that will provide new business opportunities, revenues, and efficiencies  to network operations.

  • Line Scan Camera

    Piranha4 - Teledyne DALSA

    The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.

  • Crocodile Clip Set

    142-4 - Electronic Specialties Inc.

    Large crocodile clips designed to hold fast while taking diagnostic measurements. This is the perfect complement to your testing arsenal - compatible with Electronic Specialties 142-1. These clips are CATIII 1000V safety rated and capable of measuring up to 10 amps. These are high quality clips and the Multi-Purpose tooth pattern provides plenty of holding power. These clips have a very wide jaw opening and are capable of clamping to your typical battery post. These are sold in a set of 2, one red and one black clip. Test with confidence.

  • Multiplexer 2:1 With De-Emphasis 32 Gb/s

    M8062A - Keysight Technologies

    R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.

  • AMIDA 2020XP Tester

    Amida Technology, Inc.

    AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end

  • Display Color Analyzer

    Model 7123 - Chroma ATE Inc.

    Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station

  • Pulse Pattern Generator, 3.35 GHz, single channel

    81133A - Keysight Technologies

    The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.

  • 400, 200, 100 Gbit Error Rate Tester

    PAM-4 BERT - Munich-Instruments GmbH

    The MI-PE5610-1 is a PAM-4  BERT with an integrated propriety, optical PAM-4 modulator. ROSA testing is tremebous simpliefied by the integration of the optical PAM-4 modulator in the BERT chassis. This ROSA testing solution saves time and avoids trouble shooting and accelerates your product development. The BERT provides an excellent optical PAM-4 reference output signal with adjustable OMA of the three PAM-4 eyes.The implemented 3-Eye BER technique measures the BER in real time of the 3 eyes simultanously.A wide range of selectable pattern for compliance test and signal analysis is supported.

  • ATSC 3.0 Modulator for Lab

    ATSC 3.0 LabMod - TestTree

    ATSC 3.0 LabMod is the STL Gateway compliant modulator for laboratories. Compact, portable and easy-to-use, LabMod covers the whole ATSC 3.0 standard with LDM support. In addition, LabMod performs channel simulation, noise generation, RF spectrum analysis and RF recording/playing. ATSC 3.0 LabMod is the perfect modulator for discovering ATSC 3.0 standard: generate live ATSC 3.0 RF signals or IQ pattern files, record live ATSC 3.0 transmission in different places over the world (optional) and playback them to test your receiver.

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